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Current Starving the SRAM Cell: A Strategy to Improve Cell Stability and Power

机译:当前使SRAM单元饿死的策略:提高单元稳定性和功耗的策略

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In SRAM cell design, the energy consumption and cell stability are the major performance indices which need to be improved. Several techniques reported earlier attempt to improve either of the stability or the energy consumption. In this paper, a scheme is proposed which uses current starving on conventional SRAM cell to improve cell stability and also to reduce energy consumption. Unlike separating the read and write port of the SRAM cell in most of the techniques proposed earlier, this technique results more ideal voltage transfer characteristic of the cross-coupled inverter leading to larger noise margin. It also reduces the dynamic energy consumption through short circuit current reduction during state transition. The proposed technique is compared with NC-SRAM [3], IWLVC-SRAM [18], 10T-SRAM [16] and a conventional 6T-SRAM cell. The read and retention stability of the current starving SRAM (CS-SRAM) cell increases by 31 and 41%, respectively, with respect to the 6T-RAM cell. These two SNMs are also significantly higher than the other compared cells. The proposed technique consumes 22% lesser energy in comparison with the 6T-SRAM. The energy consumption is also reduced in comparison with the other compared cells. The compared cells are designed both in CMOS process and in FinFET technology (20 nm PTM library). The performance enhancement of the proposed cell maintains same trend in both technologies.
机译:在SRAM单元设计中,能耗和单元稳定性是需要改进的主要性能指标。早先报道了几种技术以试图改善稳定性或能量消耗。在本文中,提出了一种方案,该方案使用电流不足的常规SRAM单元来提高单元稳定性并降低能耗。与先前提出的大多数技术中的将SRAM单元的读写端口分开不同,该技术可产生交叉耦合反相器更理想的电压传输特性,从而导致更大的噪声容限。它还通过状态转换期间的短路电流减小来降低动态能耗。将提出的技术与NC-SRAM [3],IWLVC-SRAM [18],10T-SRAM [16]和常规的6T-SRAM单元进行了比较。相对于6T-RAM单元,当前饥饿的SRAM(CS-SRAM)单元的读取和保留稳定性分别提高了31%和41%。这两个SNM也显着高于其他比较单元。与6T-SRAM相比,拟议的技术消耗的能量少22%。与其他比较单元相比,能耗也降低了。比较的单元采用CMOS工艺和FinFET技术(20 nm PTM库)进行设计。所提出的电池的性能增强在两种技术中保持相同的趋势。

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