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RF CMOS low-phase-noise LC oscillator through memory reduction tail transistor

机译:通过减少存储器尾部晶体管实现RF CMOS低相位噪声LC振荡器

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Based on the understanding of flicker noise generation in "silicon metal-oxide semiconductor field-effect transistors" (MOSFETs), a novel method for improving the phase noise performance of a CMOS LC oscillator is presented. Zhou et al. and Hoogee have suggested that the 1/f noise can be reduced through a switched gate, and the flicker noise generated is inversely proportional to the gate switching frequency. The novel tail transistor topology is compared to the two popular tail transistor topologies, namely, the fixed biasing tail transistor and without tail transistor. Through this technique, a figure of merit of 193 dB is achieved using a fully integrated CMOS oscillator with a tank quality factor of about 9.
机译:基于对“硅金属氧化物半导体场效应晶体管”(MOSFET)中闪烁噪声产生的理解,提出了一种用于改善CMOS LC振荡器的相位噪声性能的新方法。周等。 Hoogee和Hoogee提出可以通过开关门来降低1 / f噪声,并且所产生的闪烁噪声与门开关频率成反比。将新颖的尾部晶体管拓扑与两种流行的尾部晶体管拓扑进行了比较,即固定偏置尾部晶体管和无尾部晶体管。通过这种技术,使用储罐品质因数约为9的完全集成CMOS振荡器可实现193 dB的品质因数。

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