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Impedance-Sensing CMOS Chip for Noninvasive Light Detection in Integrated Photonics

机译:用于集成光子学中无创光检测的阻抗感测CMOS芯片

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摘要

A 100-MHz-bandwidth multichannel instrument-on-chip for noninvasive light monitoring in photonic circuits by means of the impedance sensing of the waveguide (WG) conductance variation is presented. The low-noise front-end allows accessing the WG conductance with very high sensitivity and tracking its variation upon changes of the photon flux with a resolution better than 10 pS, i.e., down to -30 dBm in optical intensity. Each electronic chain features a capacitive-feedback amplifier with a bias-handling network based on subthreshold transistors, showing -50-dBc harmonic distortion at up to few nanoamperes of input leakage current and double-balanced square-wave demodulators incorporating a low-pass limiter. To downscale the area consumption, four 8× multiplexers have been designed to address a total of 32 different optical probes, featuring a 4× MOS multiplexer cell to drop out off-phase spurious injections. The ASIC opens the way to multipoint monitoring and reconfiguration in photonic systems with many sensing sites, demonstrating the suitability of this solution for the closed-loop control of complex photonic circuits.
机译:提出了一种100 MHz带宽的多通道片上仪器,该仪器通过波导(WG)电导变化的阻抗检测,用于光子电路中的非侵入性光监视。低噪声前端允许以非常高的灵敏度访问WG电导,并在光子通量变化时跟踪其变化,分辨率优于10 pS,即光强度低至-30 dBm。每个电子链均具有电容反馈放大器,该电容反馈放大器具有基于亚阈值晶体管的偏置处理网络,在高达几纳安的输入泄漏电流下可显示-50dBc的谐波失真,并带有低通限制器的双平衡方波解调器。为了降低面积消耗,设计了四个8×多路复用器以解决总共32种不同的光学探头,并具有一个4×MOS多路复用器单元以消除异相杂散注入。 ASIC开启了在具有多个感应位置的光子系统中进行多点监视和重新配置的方式,从而证明了该解决方案适用于复杂光子电路的闭环控制。

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