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Technology Drivers that Impact Packaging and PWB Structures

机译:影响包装和PWB结构的技术驱动因素

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A discussion of how the IC, and electrical performance considerations influence material property and interconnect architecture requirements, using a CTQ (critical to quality) flow-down approach. Integrated Circuits (ICs, chips) are "packaged," i.e., they are connected, or wired to first, second, and third level interconnect structures to become functional electronic devices (Figure 1). Advances in ICs have been driving changes in package structures, material requirements, and feature sizes. This article attempts to show how the IC, and electrical performance considerations influence material property and interconnect architecture requirements, using a CTQ (critical to quality) flow-down approach.
机译:使用CTQ(对质量至关重要)的下降方法,讨论IC和电气性能因素如何影响材料性能和互连架构要求。集成电路(IC,芯片)被“封装”,即它们被连接或布线到第一,第二和第三级互连结构,以成为功能性电子设备(图1)。 IC的进步一直在推动封装结构,材料要求和特征尺寸的变化。本文试图通过使用CTQ(对质量至关重要)的下降方法来说明IC和电气性能因素如何影响材料性能和互连架构要求。

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