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Advanced microelectromechanical systems-based nanomechanical testing: Beyond stress and strain measurements

机译:基于先进的微机电系统的纳米力学测试:超越压力和应变测量

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摘要

The field of in situ nanomechanics is greatly benefiting from microelectromechanical systems (MEMS) technology and integrated microscale testing machines that can measure a wide range of mechanical properties at nanometer scales, while characterizing the damage or microstructure evolution in electron microscopes. This article focuses on the latest advances in MEMS-based nanomechanical testing techniques that go beyond stress and strain measurements under typical monotonic loadings. Specifically, recent advances in MEMS testing machines now enable probing key mechanical properties of nanomaterials related to fracture, fatigue, and wear. Tensile properties can be measured without instabilities or at high strain rates, and signature parameters such as activation volume can be obtained. Opportunities for environmental in situ nanomechanics enabled by MEMS technology are also discussed.
机译:原位纳米力学领域从微机电系统(MEMS)技术和集成的微尺度试验机器极大地受益于纳米尺度的宽范围机械性能,同时表征电子显微镜中的损坏或微观结构演变。本文重点介绍了基于MEMS的纳米力学测试技术的最新进展,这些测试技术超出了典型单调载荷下的应力和应变测量。具体而言,MEMS测试机器的最近进步现在能够探测与骨折,疲劳和磨损有关的纳米材料的关键机械性能。可以在不稳定性或高应变速率下测量拉伸性能,并且可以获得诸如激活体积的特征参数。还讨论了MEMS技术启用的环境纳米力学的环境机遇。

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