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First-principles study of C_N point defects on sidewall surface of [0001]-oriented GaN nanowires

机译:[0001]取向的GaN纳米线侧壁表面C_N点缺陷的第一性原理研究

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By using the first-principles, the electronic structure and optical properties of C-N point defects on sidewall surface of [0 0 01]-oriented GaN nanowires were calculated. We found that C-N point defects are more likely to be enriched on the surface of the GaN NWs. In addition, the closer the C-N point defect to the sidewall of the GaN NWs, the greater the effects of C-N point defect to the top of valence band. The C-N point defects in different depths may lead to the yellow luminescence, and the red shift of PL spectral wavelength would occur when it tends to the surface. This may be one of the reasons for the broadening of the yellow luminescence.
机译:利用第一性原理,计算了[0 0 01]取向的GaN纳米线的侧壁表面上的C-N点缺陷的电子结构和光学性质。我们发现C-N点缺陷更有可能在GaN NW的表面上富集。此外,C-N点缺陷离GaN NW的侧壁越近,C-N点缺陷对价带顶部的影响越大。不同深度的C-N点缺陷可能导致黄色发光,并且当PL光谱波长趋于表面时会发生红色偏移。这可能是黄色发光变宽的原因之一。

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