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The effect of plating on magnetron sputtering: Residual stress and scratch behavior of Au/NiCr/Ta multi-layers

机译:电镀对磁控溅射的影响:Au / NiCr / Ta多层膜的残余应力和刮擦行为

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摘要

Au/NiCr/Ta multi-layers were deposited on Al2O3 substrate by magnetron sputtering and plating. The effect of plating technique on magnetron sputtering film in residual stress, crystal orientation and scratch resistance behavior was investigated. The all magnetron sputtering and plating films were highly textured with dominant Au-(111) orientation or a mixture of Au-(111) and Au-(200) orientation and the (111)/(200) intensity ratio were increased after plating. The residual stress in magnetron sputtering films at different substrate temperature was tensile stress with 155-400 MPa and it decreased approximately to 50 MPa after plating. The scratch resistance could be affected by the film thickness, and it increased approximately linearly with the increase of the thickness of metallic films after plating. (c) 2006 Elsevier B.V. All rights reserved.
机译:通过磁控溅射和电镀将Au / NiCr / Ta多层膜沉积在Al2O3衬底上。研究了电镀工艺对磁控溅射膜在残余应力,晶体取向和耐刮擦性能方面的影响。所有磁控溅射和镀膜都具有主要Au-(111)取向的高织构化或Au-(111)和Au-(200)取向的混合,镀后的(111)/(200)强度比增加。磁控溅射膜在不同基板温度下的残余应力为155-400 MPa的拉应力,电镀后降低至约50 MPa。耐擦伤性可能受到膜厚的影响,并且随着镀覆后金属膜厚度的增加而大致呈线性增加。 (c)2006 Elsevier B.V.保留所有权利。

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