Structural and electrical characterization of strontium bismuth tantalate (SBT) thin films

摘要

Ferroelectric strontium bismuth tantalate (SBT) thin films were deposited by thermal metalorganic chemical vapour deposition (MOCVD) onto a complex layered Pt/IrO2/Ir/Ti(Al)N substrate. A study of ultra-violet (UV)-assisted rapid thermal processing (RTP) annealing strategies of the SBT thin films was performed. The influence of UV irradiation temperature and annealing atmosphere on the crystallinity of the deposited films was evaluated using both microstructural and electrical analysis techniques. A UV-RTP strategy in an oxygen atmosphere above 400 degrees C, followed by a furnace treatment at 700 degrees C, provided an optimum remnant polarization figure of merit. (c) 2005 Elsevier B.V. All rights reserved.