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Si islands with 1×1 termination formed by desorption of Tl from Si(111) surface

机译:通过从Si(111)表面解吸Tl形成具有1×1末端的Si岛

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摘要

We report on the scanning tunneling microscopy observation of small Si islands with a 1 × 1 termination on the Si(111) surface. The islands were prepared by thermal desorption of Tl from the Tl-terminated silicon sample by means of annealing to 400-600 ℃. Structure of the islands is interpreted as the dimer-stacking-fault (DS) model. We propose that the otherwise unfavorable 1×1 termination is stabilized by subsurface dimers of DS.
机译:我们报告了在Si(111)表面具有1×1终止的小Si岛的扫描隧道显微镜观察。通过退火至400-600℃,从T1终止的硅样品中解吸T1来制备岛。岛的结构被解释为二聚体-堆叠-故障(DS)模型。我们建议通过DS的地下二聚体来稳定否则会不利的1×1终止。

著录项

  • 来源
    《Applied Surface Science》 |2009年第4期|1168-1170|共3页
  • 作者

    P. Kocan; H. Tochihara;

  • 作者单位

    Department of Molecular and Material Sciences, Kyushu University, Kasuga, Fukuoka 816-8580, Japan Charles University in Prague, Faculty of Mathematics and Physics, Department of Surface and Plasma Science, V Holesovickdch 2, 180 00 Praha 8, Czech Republic;

    Department of Molecular and Material Sciences, Kyushu University, Kasuga, Fukuoka 816-8580, Japan;

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  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    scanning tunneling microscopy; silicon; thallium; si(111);

    机译:扫描隧道显微镜硅;铊;si(111);
  • 入库时间 2022-08-18 03:07:53

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