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Crystallization Of Hydrogenated Amorphous Silicon Carbon Films With Laser And Thermal Annealing

机译:氢化非晶硅碳薄膜的激光退火和热退火

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The crystallization of silicon rich hydrogenated amorphous silicon carbon films prepared by Plasma Enhanced Chemical Vapor Deposition technique has been induced by excimer laser annealing as well as thermal annealing. The excimer laser energy density (E_d) and the annealing temperature were varied from 123 to 242 mJ/cm~2 and from 250 to 1200 ℃ respectively. The effects of the two crystallization processes on the structural properties and bonding configurations of the films have been studied. The main results are that for the laser annealed samples, cubic SiC crystallites are formed for E_d ≥ 188 mJ/ cm~2, while for the thermal annealed samples, micro-crystallites SiC and polycrystalline hexagonal SiC are observed for the annealing temperature of 800 and 1200 ℃ respectively. The crystallinity degree has been found to improve with the increase in the laser energy density as well as with the increase in the annealing temperature.
机译:通过准分子激光退火以及热退火已经诱导了通过等离子体增强化学气相沉积技术制备的富含硅的氢化非晶硅碳膜的结晶。准分子激光能量密度(E_d)和退火温度分别在123至242mJ / cm〜2和250至1200℃之间变化。研究了两种结晶过程对薄膜结构性能和键合构型的影响。主要结果是,对于激光退火的样品,在E_d≥188 mJ / cm〜2时形成立方晶SiC晶粒,而对于热退火的样品,在800℃和850℃的退火温度下观察到微晶SiC和多晶六方SiC。分别为1200℃。已经发现结晶度随着激光能量密度的增加以及退火温度的增加而改善。

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