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Influence Of Co Doping Content On Its Valence State In Zn_(1-x)co_xo (0 ≤ X ≤ 0.15) Thin Films

机译:Zn_(1-x)co_xo(0≤X≤0.15)薄膜中Co掺杂含量对其价态的影响

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摘要

Zn_(1-x)Co_xO (0 ≤ x ≤ 0.15) thin films grown on Si (1 0 0) substrates were prepared by a sol-gel technique. The effects of Co doped on the structural, optical properties and surface chemical valence states of the Zn_(1-x)Co_xO (0 ≤ x ≤ 0.15) films were investigated by X-ray diffraction (XRD), ultraviolet-visible spectrometer and X-ray photoelectron spectroscopy (XPS). XRD results show that the Zn_(1-x)Co_xO films retained a hexagonal crystal structure of ZnO with better c-axis preferred orientation compared to the undoped ZnO films. The optical absorption spectra suggest that the optical band-gap of the Zn_(1-x)Co_xO thin films varied from 3.26 to 2.79 eV with increasing Co content from x= 0 to x= 0.15. XPS studies show the possible oxidation states of Co in Zn_(1-x)Co_xO (0 ≤ x ≤ 0.05), Zn_(0-90)Co_(0.10)O and Zn_(0.85)Co_(0.15)O are CoO, Co_3O_4 and Co_2O_3, with an increase of Co content, respectively.
机译:通过溶胶-凝胶技术制备在Si(1 0 0)衬底上生长的Zn_(1-x)Co_xO(0≤x≤0.15)薄膜。通过X射线衍射(XRD),紫外可见光谱仪和X射线研究了Co掺杂对Zn_(1-x)Co_xO(0≤x≤0.15)薄膜的结构,光学性质和表面化学价态的影响。射线光电子能谱(XPS)。 XRD结果表明,与未掺杂的ZnO薄膜相比,Zn_(1-x)Co_xO薄膜保留了ZnO的六方晶体结构,具有更好的c轴优先取向。光学吸收光谱表明,随着Co含量从x = 0增加到x = 0.15,Zn_(1-x)Co_xO薄膜的光学带隙在3.26eV至2.79eV之间变化。 XPS研究表明,Co在Zn_(1-x)Co_xO(0≤x≤0.05),Zn_(0-90)Co_(0.10)O和Zn_(0.85)Co_(0.15)O中可能的氧化态为CoO,Co_3O_4和Co_2O_3,分别随着Co含量的增加而增加。

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