首页> 外文期刊>Applied Surface Science >Structural, morphological, optical and gas sensing properties of pure and Ru doped SnO2 thin films by nebulizer spray pyrolysis technique
【24h】

Structural, morphological, optical and gas sensing properties of pure and Ru doped SnO2 thin films by nebulizer spray pyrolysis technique

机译:雾化器喷雾热解纯Ru掺杂SnO2薄膜的结构,形貌,光学和气敏特性

获取原文
获取原文并翻译 | 示例

摘要

Tin oxide thin films doped with different concentrations of ruthenium were deposited on the glass substrates at 450 degrees C by nebulizer spray pyrolysis technique. The structural, morphological, thickness and optical properties of thin films were investigated by X-ray diffraction, scanning electron microscopy, stylus profilometer and ultra violet spectrometer techniques. X-ray diffraction pattern confirms the tetragonal crystal structure for pure and ruthenium doped tin dioxide thin films. Ruthenium doped tin dioxide thin films are polycrystalline in nature. Scanning electron microscopy shows the modification of surface morphology of tin dioxide films due to varying concentration of ruthenium. Largest spheres, rings and interconnected fibers are present in the scanning electron microscopy images. Energy dispersive analysis reveals the average atomic percentage of pure and ruthenium doped tin dioxide present in the films developed. Stylus profilometer was used to measure the film thickness. Pure, 5, 10 and 15 wt% ruthenium doped tin dioxide thin films are found to have 327, 349, 386 and 425 nm thickness. Optical studies divulge that the band gap energy decreases from 3.55 eV to 3.04 eV due to the increased ruthenium concentrations. Gas sensing properties of pure and ruthenium doped tin dioxide thin films have been studied for various gases. (C) 2015 Elsevier B.V. All rights reserved.
机译:通过雾化器喷雾热解技术在450℃下将掺杂有不同浓度的钌的氧化锡薄膜沉积在玻璃基板上。通过X射线衍射,扫描电子显微镜,测针轮廓仪和紫外光谱仪技术研究了薄膜的结构,形态,厚度和光学性质。 X射线衍射图证实了纯和钌掺杂的二氧化锡薄膜的四方晶体结构。钌掺杂的二氧化锡薄膜本质上是多晶的。扫描电子显微镜显示由于钌浓度的变化,二氧化锡薄膜的表面形态发生了改变。扫描电子显微镜图像中存在最大的球体,环和互连的纤维。能量色散分析揭示了所显影薄膜中存在的纯净和钌掺杂的二氧化锡的平均原子百分数。测针轮廓仪用于测量薄膜厚度。发现纯的,5、10和15重量%的钌掺杂的二氧化锡薄膜具有327、349、386和425nm的厚度。光学研究表明,由于钌浓度增加,带隙能从3.55 eV降低到3.04 eV。已对各种气体研究了纯钌掺杂的二氧化锡薄膜的气敏特性。 (C)2015 Elsevier B.V.保留所有权利。

著录项

  • 来源
    《Applied Surface Science》 |2015年第15期|931-939|共9页
  • 作者单位

    Sri Ramakrishna Miss Vidyalaya Coll Arts & Sci, Dept Phys, Coimbatore 641020, Tamil Nadu, India;

    Sri Ramakrishna Miss Vidyalaya Coll Arts & Sci, Dept Phys, Coimbatore 641020, Tamil Nadu, India;

    Sri Ramakrishna Miss Vidyalaya Coll Arts & Sci, Dept Phys, Coimbatore 641020, Tamil Nadu, India;

    Adhiyaman Coll Engn & Technol, Dept Phys, Hosur 635109, India;

    Sri Ramakrishna Miss Vidyalaya Coll Arts & Sci, Dept Phys, Coimbatore 641020, Tamil Nadu, India;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Thin films; Nebulizer spray pyrolysis; Ruthenium; Gas sensing;

    机译:薄膜;雾化器喷雾热解;钌;气体感测;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号