首页> 外文期刊>IEEE Transactions on Applied Superconductivity >Fabrication of high quality Nb/AlO/sub x/-Al/Nb Josephson junctions. I. Sputtered Nb films for junction electrodes
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Fabrication of high quality Nb/AlO/sub x/-Al/Nb Josephson junctions. I. Sputtered Nb films for junction electrodes

机译:高质量Nb / AlO / sub x / -Al / Nb Josephson结的制造。 I.结电极溅射Nb膜

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The stress, surface morphology, superconducting characteristics, and crystal structure of sputtered Nb films were evaluated to judge their applicability to Josephson-junction electrodes. The film qualities were compared between Nb films deposited by DC and RF magnetron sputtering. The authors concluded that DC-sputtered Nb films are more suitable for junction electrodes and studied the relationship between their film quality and sputtering parameters. They observed that the Nb film characteristics were determined solely by the cathode voltage during sputtering regardless of the other parameters. The authors discuss the changes in film characteristics during Josephson integrated circuit processing.
机译:评估了溅射Nb薄膜的应力,表面形态,超导特性和晶体结构,以判断其在Josephson结电极上的适用性。比较了通过直流磁控溅射和射频磁控溅射沉积的Nb薄膜的薄膜质量。作者得出的结论是,直流溅射Nb膜更适用于结电极,并研究了其膜质量与溅射参数之间的关系。他们观察到,Nb膜特性仅由溅射过程中的阴极电压决定,而与其他参数无关。作者讨论了约瑟夫森集成电路处理过程中薄膜特性的变化。

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