首页> 外文期刊>IEEE Transactions on Applied Superconductivity >Measurement of microwave magnetic properties of superconducting YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// thin films
【24h】

Measurement of microwave magnetic properties of superconducting YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// thin films

机译:超导YBa / sub 2 / Cu / sub 3 / O / sub 7- / spl delta //薄膜的微波磁性能测量

获取原文
获取原文并翻译 | 示例

摘要

The magnetic property of high-T/sub c/ superconductors (HTS) at microwave frequency has been of increasing interest since their magnetic behavior is related to microwave vortex dynamics. Thus, we recently designed a cavity perturbation system (CPS) for simultaneous measurement of the resonant frequency (f/sub 0/) and the quality factor (Q). The magnetic susceptibilities (/spl chi/'-j /spl chi/") of YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta///MgO thin films at microwave frequencies were investigated and could be analyzed by cavity perturbation theory. We expected that the microwave magnetic susceptibility data as a function of temperature measured using the HTS thin film would explain the phenomenological superconducting dispersion relation. The transition temperature is 91 K and the temperature corresponding maximum imaginary part (/spl chi/") is 85 K. However, the transition temperature and surface resistance (R/sub s/) measured by a conventional transmission-line method were 86 K and 180 /spl mu//spl Omega/ at 40 K, respectively. We found absolute differences between the cavity perturbation method and the transmission line ones, and suggested the CPS is one of the most promising technique for measuring the magnetic susceptibility of HTS thin film with a 0.1/spl sim/1 /spl mu/m thickness.
机译:高T / sub c /超导体(HTS)在微波频率下的磁性能受到越来越多的关注,因为它们的磁行为与微波涡旋动力学有关。因此,我们最近设计了一个腔扰动系统(CPS),用于同时测量谐振频率(f / sub 0 /)和品质因数(Q)。研究了YBa / sub 2 / Cu / sub 3 / O / sub 7- / spl delta /// MgO薄膜在微波频率下的磁化率(/ spl chi /'-j / spl chi /“)。我们希望用HTS薄膜测量的微波磁化率数据作为温度的函数可以解释现象超导色散关系,过渡温度为91 K,温度对应的最大虚部为(/ spl chi /”)为85K。然而,通过常规的传输线方法测得的转变温度和表面电阻(R / subs /)在40K下分别为86K和180 /splμ// splΩ/。我们发现腔体摄动法和传输线摄动法之间存在绝对差异,并表明CPS是测量厚度为0.1 / spl sim / 1 / spl mu / m的HTS薄膜磁化率的最有前途的技术之一。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号