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Microstructure and Jc improvements in overpressure processed Ag-sheathed Bi-2223 tapes

机译:超压处理过的Ag护套Bi-2223胶带的微观结构和Jc改进

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Overpressure (OP) processing influences the microstructure and critical current density (Jc) of Ag sheathed Bi-2223 tapes. SEM and mass density measurements show higher core density and fewer micro-cracks in OP tape than in 1 atm tape. The self-field critical current density, Jc (0 T, 77 K) in multifilamentary tapes was increased from 33.5 kA/cm2 with 1 atm processing (1 atm IR) to 48 kA/cm2 with OP processing (OP pressure = 148 atm) after the first heat treatment (OP HT1), and to 58.7 kA/cm2 with OP processing after intermediate rolling (OP IR). The corresponding values for Jc (0.1 T, 77 K) are 12.3 kA/cm2 (1 atm IR) to 18.2 kA/cm2 for OP HT1 and to 22.4 kA/cm2 for OP IR.
机译:过压(OP)处理会影响Ag包覆的Bi-2223胶带的微观结构和临界电流密度(Jc)。 SEM和质量密度测量显示,与1 atm胶带相比,OP胶带的芯密度更高,微裂纹更少。复丝带中的自电场临界电流密度Jc(0 T,77 K)从采用1 atm处理(1 atm IR)的33.5 kA / cm2增加到采用OP处理(OP压力= 148 atm)的48 kA / cm2第一次热处理后(OP HT1),并在中间轧制(OP IR)后进行OP处理达到58.7 kA / cm2。 Jc(0.1 T,77 K)的相应值为OP HT1为12.3 kA / cm2(1 atm IR)至18.2 kA / cm2,OP IR为22.4 kA / cm2。

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