Design, Fabrication, and Testing of a Low AC-Loss Conduction-Cooled Cryostat for Magnetization Loss Measurement Apparatus

摘要

Conduction cooling has become a viable alternative for cooling superconducting devices. However, the thermal pathways of a conduction-cooled cryostat can be problematic for applications where time-varying magnetic fields are present. Such alternating magnetic fields are present, e.g., in a magnetization ac-loss measurement system. The losses in the thermal pathways are unwanted as they increase the heat load into the cryostat and interfere with the measurement. To solve this challenge, a conduction-cooled cryostat with special attention in limiting eddycurrent losses in the cryostat structures was constructed. The design process is illustrated in detail starting from the specifications and proceeding through the fabrication of individual components. The loss dissipated in the cryostat is experimentally examined, and the finished conduction-cooled magnetization loss measurement system is demonstrated by characterizing a multifilamentary MgB conductor.