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首页> 外文期刊>Applied Physics >A facile fabrication of Sn-doped CeO_2 nanocrystalline thin films with enhanced photodiode properties for optoelectronic applications
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A facile fabrication of Sn-doped CeO_2 nanocrystalline thin films with enhanced photodiode properties for optoelectronic applications

机译:具有增强光电二极管性能的SN掺杂CeO_2纳米晶薄膜的容纳制造,用于光电应用

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摘要

The advancement of p-n photodiode fabrication employing rare-earth materials has created cogent interest in the field of semiconductor device technology. We report on the formation of pure and Sn-doped CeO_2 thin films assembled through spray pyrolysis technique to enhance the p-Si/n-Sn:CeO_2 diode performance. A polycrystalline nature of cubical crystal structured Sn-CeO_2 thin films was developed on glass slides with various doping levels of tin (0, 2, 4 and 6 wt%). The crystallite size was found to decline with increasing Sn wt%. A uniform surface with tiny spherical-like crystallite grains was observed through the FE-SEM microscope. The existence of Sn ions with the CeO_2 system was confirmed by the EDX and XPS spectrum. The effect of Sn doping on the optical absorption and band gap of CeO_2 was evaluated, in which the 2 wt% Sn exhibited lower Eg value with maximum absorption. The Sn ions enhanced the electrical conductivity suggesting the semiconducting nature of the films. The p-Si/n-Sn:CeO_2 diode was fabricated, and its performance was analyzed under dark and light intensity of 100 mW/cm~2. The photosensitivity of the device varied from 17.11 to 671.65%. The ON-OFF photoresponse of 6 wt% Sn is relatively higher than that of pure CeO_2.
机译:采用稀土材料的P-N光电二极管制造的推进已经在半导体器件技术领域创造了易受兴趣的兴趣。我们报告了通过喷雾热解技术组装的纯和Sn掺杂CeO_2薄膜的形成,以增强P-Si / N-Sn:CEO_2二极管性能。在具有各种掺杂水平的锡(0,2,4和6wt%)的玻璃载玻片上开发了立方晶结构Sn-CeO_2薄膜的多晶性质。发现微晶尺寸随着Sn wt%的增加而下降。通过Fe-SEM显微镜观察到具有微小球形微晶晶粒的均匀表面。通过EDX和XPS光谱确认了CEO_2系统的SN离子的存在。评价SN掺杂对CEO_2的光学吸收和带隙的影响,其中2wt%Sn显示出具有最大吸收的较低的例如值。 Sn离子增强了导电性,表明薄膜的半导体性质。 P-Si / N-Sn:制造CEO_2二极管,在100mW / cm〜2的暗和光强度下分析其性能。该装置的光敏性从17.11变化到671.65%。 6wt%Sn的开关光响应比纯CEO_2相对高。

著录项

  • 来源
    《Applied Physics》 |2021年第3期|173.1-173.16|共16页
  • 作者单位

    Department of Physics Sri Ramakrishna Mission Vidyalaya College of Arts and Science Coimbatore Tamil Nadu 641 020 India St. Jude's Public School and Junior College Kotagiri Nilgiris Tamil Nadu 643 217 India;

    Department of Physics Sri Ramakrishna Mission Vidyalaya College of Arts and Science Coimbatore Tamil Nadu 641 020 India;

    Department of Physics Sri Ramakrishna Mission Vidyalaya College of Arts and Science Coimbatore Tamil Nadu 641 020 India;

    Department of Physics Sri Ramakrishna Mission Vidyalaya College of Arts and Science Coimbatore Tamil Nadu 641 020 India;

    Department of Physics Department of Physics PSG Institute of Technology and Applied Research Coimbatore Tamil Nadu 641062 India;

    Research Center for Advanced Materials Science (RCAMS) King Khalid University P.O.Box 9004 Abha 61413 Saudi Arabia Advanced Functional Materials and Optoelectronic Laboratory (AFMOL) Department of Physics Faculty of Science King Khalid University Abha 61413 Saudi Arabia Nanoscience Laboratory for Environmental and Bio-Medical Applications (NLEBA) Semiconductor Lab. Metallurgical Lab. 2 Physics Department Faculty of Education Ain Shams University Roxy 11757 Cairo Egypt;

    Advanced Functional Materials and Optoelectronic Laboratory (AFMOL) Department of Physics Faculty of Science King Khalid University Abha 61413 Saudi Arabia;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Sn-doped CeO_2 films; p-n junction diode; Spray pyrolysis; Photosensitivity; Ⅰ-Ⅴ characterization;

    机译:SN-掺杂的CEO_2电影;P-n结二极管;喷雾热解;光敏性;Ⅰ-ⅴ表征;

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