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首页> 外文期刊>Applied Physics >Influence of Burstein-Moss effect on photoexcitation and heating of silicon by short and ultrashort laser pulses at wavelength 1.06 μm
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Influence of Burstein-Moss effect on photoexcitation and heating of silicon by short and ultrashort laser pulses at wavelength 1.06 μm

机译:Burstein-Moss效应对波长为1.06μm的短和超短激光脉冲对硅的光激发和加热的影响

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摘要

The theoretical research of the influence of Burstein-Moss effect (the effect of interband absorption saturation in semiconductors) on the processes of photoexcitation and heating of monocrystalline silicon under pulsed laser action with pulse durations in the range from hundreds of femtoseconds to hundreds of nanoseconds at the wavelength near the edge of interband absorption (1.06 mu m) was conducted. It was shown that interband absorption saturation effect has the largest impact for picosecond laser pulses. Taking this effect into account in the model presented in this work allows to bring calculated melting thresholds for silicon in accordance with experimental results for wide range of pulse durations. Also, the influence of the effect of band edges filling by carriers during electron-phonon relaxation on the absorption of the second pulse when irradiating using double-pulse femtosecond laser action technique was studied.
机译:Burstein-Moss效应(半导体中的带间吸收饱和的影响)对脉冲激光作用下单晶硅的光激发和加热过程的影响的理论研究,脉冲持续时间范围为数百飞秒至几百纳秒。进行带间吸收边缘附近的波长(1.06μm)。结果表明,带间吸收饱和效应对皮秒激光脉冲影响最大。在这项工作中提出的模型中考虑到这种影响,可以根据宽脉冲持续时间范围内的实验结果来计算硅的熔化阈值。此外,研究了在使用双脉冲飞秒激光作用技术进行电子声子弛豫期间,载流子在电子的声子弛豫过程中填充的能带边缘对第二脉冲吸收的影响。

著录项

  • 来源
    《Applied Physics》 |2018年第12期|803.1-803.10|共10页
  • 作者单位

    ITMO Univ 49 Kronverksky Pr St Petersburg 197101 Russia;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
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