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首页> 外文期刊>Applied Physics >The influence of ZnO seed layers on n-ZnO nanostructure/p-GaN LEDs
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The influence of ZnO seed layers on n-ZnO nanostructure/p-GaN LEDs

机译:ZnO种子层对n-ZnO纳米结构/ p-GaN LED的影响

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摘要

Light-emitting diodes (LEDs) were formed by hydrothermally growing n-ZnO nanostructures on p-GaN with or without seed layers. The performance of the fabricated LEDs was studied. The seed layers not only have a great influence on the morphology and density of the ZnO nanostructures but also determine the lighting bias and emitting mechanism. The LEDs without seed layers and with sputtered seed layers exhibit light emission only under reverse bias, which is believed due to the GaN buffer layer/p-GaN p-n junction. The LEDs with sol-gel seed layers exhibit light emission under both forward and reverse biases. With the increase of the forward bias, the LEDs first demonstrate a red electroluminescence emission coming from the sol-gel seed layers and then demonstrate an orange emission coming from the ZnO nanorods. The sol-gel seed layer and the interface play a very important role in the electroluminescence.
机译:通过在具有或不具有种子层的p-GaN上水热生长n-ZnO纳米结构来形成发光二极管(LED)。研究了制成的LED的性能。种子层不仅对ZnO纳米结构的形貌和密度有很大的影响,而且决定了光照的偏向和发光机理。没有籽晶层和具有溅射籽晶层的LED仅在反向偏置下才显示发光,这被认为是由于GaN缓冲层/ p-GaN p-n结。具有溶胶-凝胶种子层的LED在正向和反向偏压下均显示出发光。随着正向偏压的增加,LED首先显示出来自溶胶-凝胶种子层的红色电致发光发射,然后显示出来自ZnO纳米棒的橙色发射。溶胶-凝胶种子层和界面在电致发光中起着非常重要的作用。

著录项

  • 来源
    《Applied Physics》 |2012年第2期|p.489-495|共7页
  • 作者单位

    State Key Laboratory of ASIC and Systems, Department of Microelectronics, Fudan University, Shanghai 200433, China;

    State Key Laboratory of ASIC and Systems, Department of Microelectronics, Fudan University, Shanghai 200433, China;

    Institute of Opto-Electronic Materials and Technology, South China Normal University, Guangzhou 510631, China;

    State Key Laboratory of ASIC and Systems, Department of Microelectronics, Fudan University, Shanghai 200433, China;

    State Key Laboratory of ASIC and Systems, Department of Microelectronics, Fudan University, Shanghai 200433, China;

    State Key Laboratory of ASIC and Systems, Department of Microelectronics, Fudan University, Shanghai 200433, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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