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Recombination dynamics of excitons in ZnO/ZnMgO multiple quantum wells grown on silicon substrate

机译:硅衬底上生长的ZnO / ZnMgO多量子阱中激子的复合动力学

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摘要

Time-resolved photoluminescence measurements were taken at various temperatures to investigate the behavior of excitons in ZnO/Zn_(0.9)Mg_(0.1)O multiple quantum wells (MQWs) grown on Si substrate using epitaxial Lu_2O_3 buffer layer by pulsed laser deposition. The temperature dependence of the radiative decay times of the emissions from both the ZnO wells and the Zn_(0.9)Mg_(0.1)O barriers is analyzed. The radiative lifetime of the well excitons exhibits linear dependence till room temperature, indicating that the excitons are effectively confined in the quantum wells and do not ther-malize to 3D excitons. The short radiative lifetime of ~ 1.15 ns indicates high radiative recombination rate at room temperature. The radiative lifetime of the barrier excitons shows approximately T~(1/2) dependence on temperature. In combination with the spectral dependence of the PL lifetime, it indicates localization of excitons in the barrier due to compositional fluctuation. The short radiative lifetime at room temperature and the weak localization energy of ~9 meV suggest that our MQWs are of high optical quality.
机译:在不同温度下进行时间分辨的光致发光测量,以研究外延Lu_2O_3缓冲层通过脉冲激光沉积在Si衬底上生长的ZnO / Zn_(0.9)Mg_(0.1)O多量子阱(MQWs)中的激子行为。分析了ZnO阱和Zn_(0.9)Mg_(0.1)O势垒的发射辐射的辐射衰减时间的温度依赖性。阱激子的辐射寿命直到室温都呈线性依赖性,这表明激子有效地局限在量子阱中,并且不会热化为3D激子。 〜1.15 ns的短辐射寿命表明室温下的高辐射复合率。势垒激子的辐射寿命对温度的依赖性约为T〜(1/2)。结合PL寿命的光谱依赖性,它表明由于组成波动,激子在势垒中的定位。室温下的辐射寿命短,定位能量约9 meV,这表明我们的MQW具有很高的光学质量。

著录项

  • 来源
    《Applied Physics 》 |2016年第11期| 962.1-962.6| 共6页
  • 作者单位

    State Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China;

    State Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China;

    State Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China;

    State Key Laboratory of Silicon Materials, School of Materials Science and Engineering, Zhejiang University, Hangzhou 310027, People's Republic of China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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