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Fabrication of lateral npn-phototransistors with high gain and sub-μm spatial resolution

机译:具有高增益和亚微米空间分辨率的横向npn光电晶体管的制造

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摘要

A novel kind of phototransistor with high gain and sub-μm spatial resolution is fabricated by focused laser beam-induced Zn doping of an n-modulation doped GaAs/Al_(0.4)Ga_(0.6)As quantum well structure. To produce this lateral npn-structure, p-doped lines are directly written over a mesa without degrading the quality of the sample. The local Zn doping causes an effective potential barrier for electrons. Photogenerated holes reduce this barrier and amplify the thermionic electron current. Spatially resolved photocurrent measurements show typical responsivities above 10~3 A/W and linewidths as small as 605 nm.
机译:通过聚焦调制n掺杂的GaAs / Al_(0.4)Ga_(0.6)As量子阱结构的激光束诱导Zn掺杂,制备了一种具有高增益和亚微米空间分辨率的新型光电晶体管。为了产生这种横向npn结构,在不降低样品质量的情况下,将p掺杂线直接写入台面。局部Zn掺杂对电子产生有效的势垒。光生空穴减少了该势垒,并放大了热电子电流。空间分辨光电流测量结果显示,典型响应率在10〜3 A / W以上,线宽小至605 nm。

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