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Effects of poling, and implications for metastable phase behavior in barium strontium titanate thin film capacitors

机译:钛酸钡锶钛薄膜电容器的极化作用及其对亚稳态相行为的影响

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Barium strontium titanate (Ba_(0.5)Sr_(0.5)TiO_(3)-BST) thin film capacitor structures were made using pulsed laser deposition, and their functional properties were monitored with varying temperature. It was found that poling at low temperature could induce distinct differences in the behavior of the dielectric constant and loss tangent, on heating. In relatively thick BST films (>~650 nm), poling the sample at 80 K produced a change from a single broad anomaly to one in which three distinct anomalies could be observed. The temperatures of these anomalies (~140, ~200, and ~260 K) were close to those known to be associated with phase transitions in bulk. Monitoring changes in polarization loops with temperature confirmed the likelihood that the dielectric anomalies observed were indeed the result of phase transitions in the films. Unusually, though, when the films were poled at 150 K, and then cooled to 80 K prior to collection of dielectric data on heating, the dielectric anomaly around 140 K was completely suppressed. The lack of a phase transition was confirmed by monitoring depolarization currents in the sample. It is suggested that poling has therefore allowed the phase state that existed at 150 K to persist metastably down to 80 K. For relatively thin BST films (<~400 nm), poling at 80 K only induced two distinct anomalies in the dielectric response (at ~200 and ~290 K). Nevertheless, poling-related metastability could again be observed: when the samples were poled at 250 K and then cooled to 80 K prior to data collection on heating, the anomaly at ~200 K was completely suppressed. These experiments suggest that metastable phase behavior could be commonplace in thin film ferroelectrics.
机译:利用脉冲激光沉积技术制备了钛酸钡锶(Ba_(0.5)Sr_(0.5)TiO_(3)-BST)薄膜电容器结构,并在不同温度下对其功能特性进行了监测。发现在低温下极化会在加热时引起介电常数和损耗角正切特性的明显差异。在相对较厚的BST膜(>〜650 nm)中,以80 K极化样品会导致从单一的宽异常转变为可以观察到三个不同异常的异常。这些异常的温度(〜140,〜200和〜260 K)接近于已知与大量相变有关的温度。监测极化环随温度的变化证实了观察到的介电异常确实是薄膜中相变的结果的可能性。但是,不寻常的是,当将薄膜极化到150 K,然后在加热收集介电数据之前冷却至80 K时,可以完全抑制140 K附近的介电异常。通过监测样品中的去极化电流可以确认没有相变。因此,建议极化可以使存在于150 K的相态持续稳定地下降到80K。对于相对薄的BST膜(<〜400 nm),以80 K极化仅会引起介电响应中两个明显的异常(在〜200和〜290 K)。尽管如此,还是可以再次观察到极化相关的亚稳态:当样品在250 K极化,然后在加热数据收集之前冷却至80 K时,〜200 K的异常被完全抑制。这些实验表明,亚稳态相行为在薄膜铁电体中很常见。

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