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Band-edge exciton states in AlN single crystals and epitaxial layers

机译:AlN单晶和外延层中的带边缘激子态

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摘要

The band-edge excitonic properties of AlN are investigated using low-temperature (1.7 K) optical reflectance and transmission measurements of samples with various crystal orientations. The A, B, and C excitons are found to have energies of 6.025, 6.243, and 6.257 eV in unstrained material, which shift with strain. The results are compared to a calculation of exciton energies and oscillator strengths to yield a crystal-field splitting of -230 meV in unstrained AlN, in good agreement with previous ab initio calculations.
机译:使用低温(1.7 K)光反射率和具有各种晶体取向的样品的透射率测量来研究AlN的带边激子性质。发现A,B和C激子在未应变的材料中具有6.025、6.243和6.257 eV的能量,它们随应变而移动。将该结果与激子能量和振荡器强度的计算结果进行比较,以在未应变的AlN中产生-230 meV的晶体场分裂,这与以前的从头算式非常吻合。

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