Variable temperature magnetic force microscopy with piezoelectric quartz tuning forks as probes optimized using Q-control

摘要

We have performed magnetic force microscopy at various temperatures utilizing piezoelectric quartz tuning forks as probes. Due to their large force constants (～10~4 N/m), quartz tuning forks are intrinsically less sensitive to force gradients than conventional cantilevers. However, we demonstrate that the technique of Q-control can be used to increase their sensitivity, making their use as probes for variable temperature magnetic force microscopy a viable option.