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Modulating the growth conditions: Si as an acceptor in (110) GaAs for high mobility p-type heterostructures

机译:调节生长条件:Si作为(110)GaAs中的受体用于高迁移率p型异质结构

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We implement metallic layers of Si-doped (110) GaAs as modulation doping in high mobility p-type heterostructures, changing to p-growth conditions for the doping layer alone. The strongly autocompensated doping is characterized in bulk samples first, identifying the metal-insulator transition density and confirming classic hopping conduction in the insulating regime. To overcome the poor morphology inherent to Si p-type (110) growth, heterostructures are then fabricated with only the modulation-doping layer grown under p-type conditions. Such heterostructures show a hole mobility of μ=1.75 X 10~5 cm~2/V s at density p=2.4X 10~(11) cm~(-2). We identify the zero-field spin-splitting characteristic of p-type heterostructures, but observe a remarkably isotropic mobility and a persistent photoconductivity unusual for p heterojunctions grown on other facets. This modulated growth technique is particularly relevant for p-type cleaved-edge overgrowth and for Ⅲ-Ⅴ growth chambers, where Si is the only dopant.
机译:我们在高迁移率p型异质结构中实现了Si掺杂(110)GaAs的金属层作为调制掺杂,仅改变了掺杂层的p生长条件。首先在块状样品中对强自动补偿掺杂进行了表征,确定了金属-绝缘体的转变密度并确认了绝缘状态下的经典跳跃传导。为了克服Si p型(110)生长固有的不良形貌,然后仅在p型条件下生长调制掺杂层,即可制造异质结构。这样的异质结构在密度p = 2.4X 10〜(11)cm〜(-2)时显示出的空穴迁移率为μ= 1.75 X 10〜5 cm〜2 / V s。我们确定了p型异质结构的零场自旋分裂特征,但观察到明显的各向同性迁移率和在其他方面生长的p异质结不寻常的持久光电导性。这种调制生长技术特别适用于p型劈边过度生长和Ⅲ-Ⅴ生长室,其中Si是唯一的掺杂物。

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