首页> 外文期刊>Applied Physics Letters >Density functional theory study of adsorption and dissociation of HfCl_4 and H_2O on Ge/Si(100)-(2X1): Initial stage of atomic layer deposition of HfO_2 on SiGe surface
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Density functional theory study of adsorption and dissociation of HfCl_4 and H_2O on Ge/Si(100)-(2X1): Initial stage of atomic layer deposition of HfO_2 on SiGe surface

机译:HfCl_4和H_2O在Ge / Si(100)-(2X1)上的吸附和解离的密度泛函理论研究:SiGe表面HfO_2原子层沉积的初始阶段

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We have investigated adsorption and dissociation of water and HfCl_4 on Ge/Si(100)-(2 X 1) surface with density functional theory. The Si-Ge heterodimer and Ge-Ge homodimer are employed to represent the Si_(1-x)Ge_x surface. The activation energy for adsorption of water on Ge-Ge homodimer is much higher than that on Si-Ge heterodimer. No net activation barrier exists during the adsorption of HfCl_4 on both SiGe surface dimers. The differences in the potential energy surface between reactions on Si-Ge and Ge-Ge dimers are due to different bond strengths. It should also be noticed that the activation energy for HfCl_4 is quite flat, thus HfCl_4 adsorbs and dissociates on Ge/Si(100)-(2 x 1) easily.
机译:我们已经用密度泛函理论研究了水和HfCl_4在Ge / Si(100)-(2 X 1)表面上的吸附和解离。 Si-Ge异二聚体和Ge-Ge同二聚体用于表示Si_(1-x)Ge_x表面。 Ge-Ge均二聚体上的水吸附活化能远高于Si-Ge异二聚体。在两个SiGe表面二聚体上吸附HfCl_4的过程中均不存在净活化障碍。 Si-Ge和Ge-Ge二聚体上的反应之间的势能表面差异是由于键合强度不同所致。还应注意,HfCl_4的活化能相当平坦,因此HfCl_4容易在Ge / Si(100)-(2 x 1)上吸附和解离。

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