The authors experimentally find that the thermal conductivity of gallium nitride depends critically on dislocation density using the 3-omega technique. For GaN with dislocation densities lower than 10~6 cm~(-2), the thermal conductivity is independent with dislocation density. The thermal conductivity decreases with a logarithmic dependence for material with dislocation densities in the range of 10~7-10~(10) cm~(-2). These results are in agreement with theoretical predictions. This study indicates that the hydride vapor phase epitaxy method offers an attractive route for the formation of semi-insulating gallium nitride with optimal thermal conductivity values around 230 W/mK and very low dislocation density near 5 X 10~4 cm~(-2).
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机译:作者通过实验发现,使用3-Ω技术,氮化镓的导热率关键取决于位错密度。对于位错密度低于10〜6 cm〜(-2)的GaN,其导热系数与位错密度无关。对于位错密度在10〜7-10〜(10)cm〜(-2)范围内的材料,热导率随对数关系而降低。这些结果与理论预测相符。这项研究表明,氢化物气相外延方法为形成半绝缘氮化镓提供了一条诱人的途径,该氮化镓的最佳导热系数约为230 W / mK,位错密度非常低,接近5 X 10〜4 cm〜(-2) 。
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