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Interference of charge carrier in a double-dot nanopillar transistor

机译:双点纳米柱晶体管中载流子的干扰

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In this study, the authors investigate the mutual interaction of quantized charge carriers in a double-dot nanopillar transistor. By coupling the dots at a distance less than the Fermi wavelength λ_F, the authors observe full size beats in current-voltage (Ⅰ-Ⅴ) characteristics at 300 K. Analysis based on the theory of electron charging shows that this quantum effect occurs at the state of n = 1. At large bias, the excitation is found rising to a group of mixing states of n=2 and n=3. The authors propose a phonon-assisted model to explain the results and find good agreement.
机译:在这项研究中,作者研究了双点纳米柱晶体管中量化电荷载体的相互作用。通过以小于费米波长λ_F的距离耦合点,作者观察到300 K时电流-电压(Ⅰ-Ⅴ)特性的全尺寸节拍。基于电子充电理论的分析表明,这种量子效应发生在n = 1的状态。在大偏置下,发现激发上升到n = 2和n = 3的一组混合状态。作者提出了声子辅助模型来解释结果并找到良好的一致性。

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