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Si/SiGe-based edge-coupled photodiode with partially p-doped photoabsorption layer for high responsivity and high-power performance

机译:具有部分p掺杂光吸收层的基于Si / SiGe的边缘耦合光电二极管,具有高响应性和高功率性能

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摘要

We demonstrate a Si/SiG-based edge-coupled photodiode that can achieve high-speed, high output power, and high responsivity performance at a wavelength of 830 nm for application to short-reach fiber communication. We incorporate a p-type-doped Si/Si_(0.5)Ge_(0.5)-based superlattice with a Si-based depletion layer to enhance the photoabsorption process and minimize the hole-trapping problem of the Si/SiGe multiple quantum well. An extremely high bandwidth-efficiency product performance (10 GHz, 276%, 27.6 GHz) and high peak output voltage (1.5 V) have been achieved simultaneously by operating this device in the avalanche regime.
机译:我们演示了一种基于Si / SiG的边缘耦合光电二极管,该二极管可在830 nm波长下实现高速,高输出功率和高响应性能,适用于短距离光纤通信。我们将p型掺杂的基于Si / Si_(0.5)Ge_(0.5)的超晶格与基于Si的耗尽层结合在一起,以增强光吸收过程并最小化Si / SiGe多量子阱的空穴俘获问题。通过在雪崩状态下操作该器件,可以同时实现极高的带宽效率产品性能(10 GHz,276%,27.6 GHz)和高峰值输出电压(1.5 V)。

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