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Patterning of indium tin oxide by projection photoablation and lift-off process for fabrication of flat-panel displays

机译:通过投射光烧蚀和剥离工艺对铟锡氧化物进行图案化以制造平板显示器

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摘要

Indium tin oxide (ITO), an important material used as a transparent conductive oxide in thin-film transistor liquid-crystal display fabrication, was patterned by a nonlithographic process. First, a Si_3N_4 substrate coated with photoresist was patterned by a projection photoablation process using 248 nm wavelength KrF excimer laser radiation. ITO was then deposited by sputtering and patterned by lift-off. The resulting ITO pattern was clean even though it was patterned without the conventional steps of photoresist development and ITO etching. This process technology provides a faster and more economical patterning capability compared to conventional photolithography and etch processes used in the display industry.
机译:铟锡氧化物(ITO)是薄膜晶体管液晶显示器制造中用作透明导电氧化物的重要材料,通过非光刻工艺进行了构图。首先,使用248nm波长的KrF准分子激光辐射通过投影光烧蚀工艺对涂覆有光致抗蚀剂的Si_3N_4衬底进行构图。然后通过溅射沉积ITO,并通过剥离图案化。即使没有传统的光刻胶显影和ITO刻蚀步骤就可以对所得的ITO图案进行清洁。与显示行业中使用的常规光刻和蚀刻工艺相比,该工艺技术提供了更快,更经济的构图能力。

著录项

  • 来源
    《Applied Physics Letters》 |2007年第26期|261102.1-261102.3|共3页
  • 作者单位

    Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 应用物理学;计量学;
  • 关键词

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