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Enhancement of room-temperature hole conductivity in narrow and strained Ge quantum well by double-side modulation doping

机译:双面调制掺杂提高窄应变Ge量子阱中室温空穴电导率

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摘要

The room-temperature two-dimensional hole gas (2DHG) conductivity as high as 649.3 μS is obtained by implementation of double-side modulation doping (DS-MOD) of an 8 nm thick strained Ge quantum well in a SiGe heterostructure. This conductivity is about three times higher than that of the conventional SiGe heterostructure with single-side modulation doping (SS-MOD). While the low-temperature (T=3 K) mobility with DS-MOD is two times higher than that with SS-MOD, the room-temperature mobility of the two is practically the same, suggesting that phonon scattering is the dominant limiting mechanism at the device operating temperatures.
机译:通过在SiGe异质结构中实施8 nm厚的应变Ge量子阱的双面调制掺杂(DS-MOD),可获得高达649.3μS的室温二维空穴气体(2DHG)电导率。该电导率是具有单侧调制掺杂(SS-MOD)的常规SiGe异质结构的电导率的三倍。尽管DS-MOD的低温迁移率是SS-MOD的两倍(T = 3 K),但两者的室温迁移率实际上是相同的,这表明声子散射是在设备的工作温度。

著录项

  • 来源
    《Applied Physics Letters》 |2007年第19期|p.192108.1-192108.3|共3页
  • 作者单位

    Research Center for Silicon Nano-Science, Advanced Research Laboratories, Musashi Institute of Technology, 8-15-1 Todoroki, Setagaya-ku, Tokyo 158-0082, Japan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 应用物理学;计量学;
  • 关键词

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