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Photoemission and x-ray absorption studies of valence states in (Ni,Zn,Fe,Ti)_3O_4 thin films exhibiting photoinduced magnetization

机译:(Ni,Zn,Fe,Ti)_3O_4薄膜中表现出磁化强度的价态的光发射和X射线吸收研究

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By means of photoemission and x-ray absorption spectroscopy, we have studied the electronic structure of (Ni,Zn,Fe,Ti)_3O_4 thin films, which exhibits a cluster glass behavior with a spin-freezing temperature T)f of ~230 K and photoinduced magnetization (PIM) below T_f The Ni and Zn ions were found to be in the divalent states. Most of the Fe and Ti ions in the thin films were trivalent (Fe~(3+)) and tetravalent (Ti~(4+)), respectively. While Ti doping did not affect the valence states of the Ni and Zn ions, a small amount of Fe~(2+) ions increased with Ti concentration, consistent with the proposed charge-transfer mechanism of PIM.
机译:通过光发射和X射线吸收光谱,我们研究了(Ni,Zn,Fe,Ti)_3O_4薄膜的电子结构,该薄膜表现出团簇玻璃行为,自旋冻结温度T)f为〜230 K T_f以下的光感应磁化(PIM)镍和锌离子处于二价态。薄膜中的大多数Fe和Ti离子分别为三价(Fe〜(3+))和四价(Ti〜(4+))。尽管Ti的掺杂不会影响Ni和Zn离子的价态,但少量的Fe〜(2+)离子会随着Ti浓度的增加而增加,这与PIM的电荷转移机理相一致。

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