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Theoretical design of GaN/ferroelectric heterostructure: Toward a strained semiconductor on ferroelectrics

机译:GaN /铁电异质结构的理论设计:针对铁电体上的应变半导体

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摘要

Ferroelectric/semiconductor heterostructures are of great interest for future electronic devices. This letter examined the material parameters and carrier distributions of an AlGaN(0001)/ GaN(0001)/BaTiO_3(111) double heterostructure by combining first principles and charge control model. Results show that in the optimized case, there will appear two channels in GaN layer, and the sheet electron density will be doubled compared to conventional AlGaN/GaN heterojunction. A possible device structure was proposed to make the channel become switchable and reduce the source/drain resistance. This strained semiconductor on ferroelectric structure may be promising for high speed power devices.
机译:铁电/半导体异质结构对未来的电子设备非常感兴趣。这封信通过结合第一原理和电荷控制模型研究了AlGaN(0001)/ GaN(0001)/ BaTiO_3(111)双异质结构的材料参数和载流子分布。结果表明,在优化的情况下,与常规的AlGaN / GaN异质结相比,GaN层中将出现两个沟道,并且薄层电子密度将增加一倍。提出了一种可能的器件结构,以使通道可切换并降低源/漏电阻。铁电结构上的这种应变半导体可能对高速功率器件很有希望。

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  • 来源
    《Applied Physicsletters》 |2009年第12期|122101.1-122101.3|共3页
  • 作者单位

    State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, People's Republic of China;

    State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, People's Republic of China;

    State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, People's Republic of China;

    State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, People's Republic of China;

    State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, People's Republic of China;

    State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, People's Republic of China;

    State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, People's Republic of China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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