机译:使用相干声子波测量的半导体点缺陷浓度分布
Department of Physics, Vanderbilt University, Nashville, Tennessee 37203, USA;
Department of Physics, Vanderbilt University, Nashville, Tennessee 37203, USA;
Department of Physics, Vanderbilt University, Nashville, Tennessee 37203, USA;
Department of Physics, Vanderbilt University, Nashville, Tennessee 37203, USA;
Department of Physics, University of Notre Dame, Notre Dame, Indiana 46556, USA;
Department of Physics, University of Notre Dame, Notre Dame, Indiana 46556, USA;
Department of Physics, Vanderbilt University, Nashville, Tennessee 37203, USA;
Department of Physics, Vanderbilt University, Nashville, Tennessee 37203, USA;
Department of Applied Science, College of William & Mary, Williamsburg, Virginia 23187, USA;
Department of Physics, Vanderbilt University, Nashville, Tennessee 37203, USA Institute of Advanced Materials, Devices, and Nanotechnologv, Rutgers University, New Brunswick, New Jersey 08901, USA;
Department of Physics, Vanderbilt University, Nashville, Tennessee 37203, USA;
机译:掺杂分布对半导体相干声子检测和产生的影响
机译:间接带隙半导体Si和GaP中的本征相干声子
机译:间接带隙半导体Si和间隙中的内在相干声学声子
机译:飞秒激光在半导体中产生相干声子的非热过程
机译:用相干声子光谱研究辐射损伤的砷化镓。
机译:压电半导体体声波谐振器中的声子-电子相互作用
机译:掺杂分布对半导体中相干声学声子检测和产生的影响
机译:使用相干声学声子的深度相关缺陷研究。