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High Mobility Organic Thin Film Transistors Based On Monocrystalline Rubrene Films Grown By Low Pressure Hot Wall Deposition

机译:基于低压热壁沉积生长的单晶Rubrene薄膜的高迁移率有机薄膜晶体管

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摘要

Monocrystalline rubrene (5,6,11,12-tetraphenylnaphthacene) films with thickness between 1 and 10 μm and grain sizes as large as 100 μm × 2 mm were deposited on thin film transistor substrates at rates ~500 nm/min by a low pressure and hot wall deposition method. Organic thin film transistors with these high quality thin films as active channels have field effect mobility as high as 2.4 cm~2/V s and ON/OFF current ratios around 10~6. The morphology and crystallinity of rubrene films under different deposition conditions were also studied to determine the optimal film deposition conditions.
机译:在低压下以〜500 nm / min的速率将厚度为1至10μm,粒径为100μm×2 mm的单晶红荧烯(5,6,11,12-四苯基萘)薄膜沉积在薄膜晶体管基板上和热壁沉积法。以这些高质量的薄膜作为有源沟道的有机薄膜晶体管的场效应迁移率高达2.4 cm〜2 / V s,开/关电流比约为10〜6。还研究了红宝石膜在不同沉积条件下的形貌和结晶度,以确定最佳的膜沉积条件。

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  • 来源
    《Applied Physicsletters》 |2009年第8期|234-236|共3页
  • 作者

    Yi Chen; Ishiang Shin;

  • 作者单位
  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

  • 入库时间 2022-08-18 03:19:29

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