首页> 外文期刊>Applied Physics Letters >Influence of the substrate temperature on the Curie temperature and charge carrier density of epitaxial Gd-doped EuO films
【24h】

Influence of the substrate temperature on the Curie temperature and charge carrier density of epitaxial Gd-doped EuO films

机译:衬底温度对掺Gd掺杂EuO薄膜居里温度和载流子密度的影响

获取原文
获取原文并翻译 | 示例

摘要

Rare earth doping is a standard, yet experimentally poorly understood method to increase the Curie temperature (T-C) of the ferromagnetic semiconductor EuO. Here, we report on the charge carrier density (n) and the T-C of commonly used 4.2 at. % Gd-doped EuO films grown by molecular-beam epitaxy on (110) oriented YAlO-3 substrates at various substrate temperatures (T-sub). Increasing T-sub leads to a decrease in n and T-C. For high substrate temperatures the Gd-doping is rendered completely inactive: n and T-C drop to the values of undoped EuO.
机译:稀土掺杂是提高铁磁半导体EuO的居里温度(T-C)的一种标准方法,但在实验上却鲜为人知。在这里,我们报告了载流子密度(n)和常用的4.2 at的T-C。通过分子束外延在各种衬底温度(T-sub)下在(110)取向的YAlO-3衬底上生长的%掺Gd的EuO薄膜。 T-sub的增加导致n和T-C的降低。对于高衬底温度,使Gd掺杂完全无效:n和T-C降至未掺杂EuO的值。

著录项

  • 来源
    《Applied Physics Letters》 |2011年第10期|p.98.102110.1-98.102110.3|共3页
  • 作者单位

    Zentrum fur Elektronische Korrelation und Magnetismus, Universitdt Augsburg, Universitaetsstrasse 1,86159 Augsburg, Germany;

    Zentrum fur Elektronische Korrelation und Magnetismus, Universitdt Augsburg, Universitaetsstrasse 1,86159 Augsburg, Germany;

    Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853, USA;

    Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853, USA;

    IBN 1-IT and JARAFIT, Forschungszentrum Juelich GmbH, 52425 Juelich, Germany;

    IBN 1-IT and JARAFIT, Forschungszentrum Juelich GmbH, 52425 Juelich, Germany;

    Department of Physics, Cornell University, Ithaca, New York 14853, USA;

    Department of Physics, Cornell University, Ithaca, New York 14853, USA;

    Department of Physics, Cornell University, Ithaca, New York 14853, USA;

    Canadian Light Source, University of Saskatchewan, Saskatoon, Saskatchewan S7N 0X4, Canada;

    Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853, USA;

    Zentrum fur Elektronische Korrelation und Magnetismus, Universitdt Augsburg, Universitaetsstrasse 1,86159 Augsburg, Germany;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号