机译:横向和基体约束对铁电纳米结构压电响应的影响
G.W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta,Georgia 30332, USA,Mechanical Engineering Department, Rose-Hulman Institute of Technology, Terre Haute, Indiana 47803, USA;
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge,Tennessee 37831, USA;
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge,Tennessee 37831, USA;
G.W. Woodruff School of Mechanical Engineering, Georgia Institute of Technology, Atlanta,Georgia 30332, USA,School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, Georgia 30332, USA;
机译:横向和基体约束对铁电纳米结构压电响应的影响
机译:横向压电响应力显微镜在180°铁电畴壁处的剪切效应
机译:悬臂屈曲对BiFeO_3纳米结构中铁电畴的矢量压电响应力显微镜成像的影响
机译:通过使用压电响应力显微镜获得的PBZR1-Xtixo3薄膜铁电域的光导效应
机译:分子连接内自组装单分子层的结构表征:金属化和衬底侧向约束的影响。
机译:电化学沉积在石墨烯/玻璃基板上合成氧化锌纳米结构:电流密度和温度的影响
机译:钙钛矿铁电纳米结构的压电响应力显微镜和表面效应