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Antireflective ZnSnO/Ag bilayer-based transparent source and drain electrodes for transparent thin film transistors

机译:透明薄膜晶体管的基于减反射ZnSnO / Ag双层的透明源电极和漏电极

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摘要

We report on antireflective ZnSnO (ZTO)/Ag bilayer and ZTO/Ag/ZTO trilayer source/drain (S/D) electrodes for highly transparent ZTO channel-based thin film transistors (TFTs). Although both bilayer and trilayer films have a similar sheet resistance (3-5 Ω/sq), the ZTO/Ag bilayer is a more effective transparent S/D electrode for ZTO channel layer than the ZTO/Ag/ZTO trilayer S/D electrode, due to the direct contact of the Ag layer on the ZTO channel layer and a desirable oxide-metal-oxide multilayer structure for antireflection effects. ZTO channel-based all-transparent TFTs with ZTO/Ag bilayer S/D electrodes exhibited a saturation mobility of 4.54 cm~2/Vs and a switching value (1.31 = V/decade), comparable to those of a ZTO channel-based TFT with metallic Ag S/D electrodes. This indicates that the antireflective ZTO/Ag bilayer is a promising transparent S/D electrode for use in all-transparent TFTs as a substitute for conventional opaque metal S/D electrodes.
机译:我们报道了用于高度透明的基于ZTO通道的薄膜晶体管(TFT)的抗反射ZnSnO(ZTO)/ Ag双层和ZTO / Ag / ZTO三层源极/漏极(S / D)电极。尽管双层膜和三层膜都具有相似的薄层电阻(3-5Ω/ sq),但是ZTO / Ag双层比ZTO / Ag / ZTO三层S / D电极对ZTO通道层来说是更有效的透明S / D电极由于在ZTO沟道层上的Ag层直接接触,并且具有理想的氧化物-金属-氧化物多层结构以产生抗反射效果,因此可以避免这种情况。具有ZTO / Ag双层S / D电极的基于ZTO通道的全透明TFT表现出4.54 cm〜2 / Vs的饱和迁移率和一个开关值(1.31 = V / decade),与基于ZTO通道的TFT相比带有金属Ag S / D电极。这表明抗反射的ZTO / Ag双层是一种有希望的透明S / D电极,可用于全透明TFT中,以替代常规的不透明金属S / D电极。

著录项

  • 来源
    《Applied Physics Letters》 |2012年第26期|p.263505.1-263505.5|共5页
  • 作者单位

    Department of Advanced Materials Engineering for Information and Electronics, Kyung Hee University,1 Seocheon-dong, Yongin-si, Gyeonggi-do 446-701, South Korea;

    OLED Research Institute, Samsung Mobility Display Co. Ltd., San #24, Nongseo-Dong, Giheung-Gu,Yongin-Si, Gyeonggi-Do 446-711, South Korea;

    OLED Research Institute, Samsung Mobility Display Co. Ltd., San #24, Nongseo-Dong, Giheung-Gu,Yongin-Si, Gyeonggi-Do 446-711, South Korea;

    Department of Advanced Materials Engineering for Information and Electronics, Kyung Hee University,1 Seocheon-dong, Yongin-si, Gyeonggi-do 446-701, South Korea;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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