机译:InGaAs / InP雪崩二极管的门控频率为1.25 GHz,在1310 nm处单光子检测效率高达50%
Joint Quantum Institute, National Institute of Standards and Technology and University of Maryland,100 Bureau Drive, Gaithersburg, Maryland 20899, USA;
Joint Quantum Institute, National Institute of Standards and Technology and University of Maryland,100 Bureau Drive, Gaithersburg, Maryland 20899, USA National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, USA;
Joint Quantum Institute, National Institute of Standards and Technology and University of Maryland,100 Bureau Drive, Gaithersburg, Maryland 20899, USA National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, Maryland 20899, USA;
机译:基于具有大幅度正弦电压的InGaAs / InP单光子雪崩二极管的单光子检测器的饱和检测效率
机译:用于InGaAs / InP单光子雪崩二极管的完全可编程单光子检测模块,具有干净的亚纳秒选通过渡
机译:使用1 GHz正弦门控InGaAs / InP雪崩光电二极管进行低定时抖动单光子检测
机译:1.25 GHz单光子检测,具有正弦门控Ingaas / InP雪崩光电二极管
机译:CMOS单光子雪崩二极管和微机械滤光片,用于集成荧光传感。
机译:门控STED显微镜与时间门控单光子雪崩二极管
机译:1.25 GHz单光子检测,具有正弦门控Ingaas / InP雪崩光电二极管