首页> 外文期刊>Photonics Technology Letters, IEEE >Low-Timing-Jitter Single-Photon Detection Using 1-GHz Sinusoidally Gated InGaAs/InP Avalanche Photodiode
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Low-Timing-Jitter Single-Photon Detection Using 1-GHz Sinusoidally Gated InGaAs/InP Avalanche Photodiode

机译:使用1 GHz正弦门控InGaAs / InP雪崩光电二极管进行低定时抖动单光子检测

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摘要

We demonstrate an efficient way to improve the timing jitter of sine-wave gated InGaAs/InP avalanche photo diode (APD) by combining sinusoidally balanced differencing and low-pass filtering techniques to minimize detrimental waveform distortion of the avalanche signal, and realize a 1-GHz gated InGaAs/InP single-photon detector with the timing jitter as low as 60 ps. The detection efficiency could reach 10.4% at 1550 nm with the maximum count rate ~100 MHz, after pulse probability ~3.0%, and dark count rate ~6.1 × 10-6 per gate. Such low timing jitter single-photon detectors offer facility for quantum key distribution at gigahertz clock rate.
机译:我们展示了一种通过组合正弦平衡差分和低通滤波技术来最小化雪崩信号的有害波形失真来改善正弦波门控的InGaAs / InP雪崩光电二极管(APD)的时序抖动的有效方法,并实现了1- GHz选通的InGaAs / InP单光子检测器,定时抖动低至60 ps。在1550 nm处的检测效率可以达到10.4%,最大计数率约为100 MHz,脉冲概率约为3.0%,每个门的暗计数率约为6.1×10 -6 。这种低定时抖动单光子检测器为以千兆赫兹时钟速率分配量子密钥提供了便利。

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