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Titanium dioxide/silicon hole-blocking selective contact to enable double-heterojunction crystalline silicon-based solar cell

机译:二氧化钛/硅空穴阻挡选择性接触以实现双异质结晶体硅基太阳能电池

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摘要

In this work, we use an electron-selective titanium dioxide (TiO_2) heterojunction contact to silicon to block minority carrier holes in the silicon from recombining at the cathode contact of a silicon-based photovoltaic device. We present four pieces of evidence demonstrating the beneficial effect of adding the TiO_2 hole-blocking layer: reduced dark current, increased open circuit voltage (V_(OC)), increased quantum efficiency at longer wavelengths, and increased stored minority carrier charge under forward bias. The importance of a low rate of recombination of minority carriers at the Si/TiO_2 interface for effective blocking of minority carriers is quantitatively described. The anode is made of a poly(3,4-ethylenedioxythiophene):poly(styrenesulfonate) heterojunction to silicon which forms a hole selective contact, so that the entire device is made at a maximum temperature of 100 ℃, with no doping gradients or junctions in the silicon. A low rate of recombination of minority carriers at the Si/TiO_2 interface is crucial for effective blocking of minority carriers. Such a pair of complementary carrier-selective heterojunctions offers a path towards high-efficiency silicon solar cells using relatively simple and near-room temperature fabrication techniques.
机译:在这项工作中,我们使用对硅的电子选择性二氧化钛(TiO_2)异质结接触来阻止硅中的少数载流子空穴在基于硅的光伏器件的阴极接触处重组。我们提供了四项证据,证明了添加TiO_2空穴阻挡层的有益效果:减少了暗电流,增加了开路电压(V_(OC)),在更长波长下增加了量子效率以及在正向偏置下增加了存储的少数载流子电荷。定量描述了Si / TiO_2界面上少数载流子的低重组率对于有效封闭少数载流子的重要性。阳极由与硅形成的聚(3,4-乙撑二氧噻吩):聚(苯乙烯磺酸盐)异质结构成,形成空穴选择性接触,因此整个器件的最高制造温度为100℃,没有掺杂梯度或结。在硅中。 Si / TiO_2界面上少数载流子的低重组率对于有效阻断少数载流子至关重要。这样的一对互补的载流子选择异质结使用相对简单且接近室温的制造技术提供了通往高效硅太阳能电池的途径。

著录项

  • 来源
    《Applied Physics Letters》 |2015年第12期|123906.1-123906.5|共5页
  • 作者单位

    Princeton Institute for the Science and Technology of Materials (PRISM), Princeton, New Jersey 08544, USA,Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544, USA;

    Princeton Institute for the Science and Technology of Materials (PRISM), Princeton, New Jersey 08544, USA,Centre for Nano Science and Engineering (CeNSE), Indian Institute of Science (IISc), Bangalore, Karnataka, India;

    Princeton Institute for the Science and Technology of Materials (PRISM), Princeton, New Jersey 08544, USA,Department of Chemistry, Princeton University, Princeton, New Jersey 08544, USA;

    Princeton Institute for the Science and Technology of Materials (PRISM), Princeton, New Jersey 08544, USA,Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544, USA;

    Princeton Institute for the Science and Technology of Materials (PRISM), Princeton, New Jersey 08544, USA,Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544, USA;

    Princeton Institute for the Science and Technology of Materials (PRISM), Princeton, New Jersey 08544, USA,Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544, USA;

    Princeton Institute for the Science and Technology of Materials (PRISM), Princeton, New Jersey 08544, USA,Department of Chemistry, Princeton University, Princeton, New Jersey 08544, USA;

    Princeton Institute for the Science and Technology of Materials (PRISM), Princeton, New Jersey 08544, USA,Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544, USA;

    Princeton Institute for the Science and Technology of Materials (PRISM), Princeton, New Jersey 08544, USA,Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544, USA;

    Princeton Institute for the Science and Technology of Materials (PRISM), Princeton, New Jersey 08544, USA,Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544, USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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  • 入库时间 2022-08-18 03:15:06

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