机译:STEM光学深度切片中的单个原子可见性
Institute of Engineering Innovation, University of Tokyo, Bunkyo, Tokyo 113-8656, Japan;
Department of Materials Science and Engineering, National University of Singapore, Singapore 177576;
Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA;
School of Physics and Astronomy, Monash University, Victoria 3800, Australia;
Institute of Engineering Innovation, University of Tokyo, Bunkyo, Tokyo 113-8656, Japan;
Institute of Engineering Innovation, University of Tokyo, Bunkyo, Tokyo 113-8656, Japan ,Nanostructures Research Laboratory, Japan Fine Ceramics Center, Nagoya, Aichi 456-8587, Japan;
机译:深度切片与HAADF杆中的原子计数结合以检索3D原子结构
机译:离子原子波-离子-原子碰撞中单个电离截面的计算
机译:像差校正扫描透射电子显微镜对单个掺杂原子的深度剖分
机译:茎中光学切片观察与GaN中的脱位相关的深度依赖性原子位移
机译:使用磁光阱来测量离子-原子碰撞截面。
机译:更正:YoshieT.等。光学微腔:感应到单个分子和原子。传感器2011111972–1991
机译:原子和离子与原子碰撞造成的单个电子损失的总伯恩近似截面