...
首页> 外文期刊>Applied physics express >Increase in the efficiency of spin detection based on GaAsSb by applying a longitudinal magnetic field or a postgrowth annealing process
【24h】

Increase in the efficiency of spin detection based on GaAsSb by applying a longitudinal magnetic field or a postgrowth annealing process

机译:通过施加纵向磁场或后生长退火工艺,可以提高基于GaAsSb的自旋检测效率

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

A substantial improvement in the efficiency of spin detection based on GaAs_(0.94)Sb_(0.06) is realized by applying either a longitudinal magnetic field or a postgrowth annealing process. The degree of optical spin polarization can be increased from ~19 to ~40% at ~105K under a longitudinal magnetic field of 10T. On the other hand, through the shortening of the electron lifetime by the use of a postgrowth annealing process, the efficiency for optical spin detection can be enhanced by a factor of nearly 4 from ~6 to ~23% at ~180K under zero external magnetic field.
机译:通过施加纵向磁场或生长后退火工艺,可以实现基于GaAs_(0.94)Sb_(0.06)的自旋检测效率的显着提高。在10T的纵向磁场下,在〜105K时,光学自旋极化度可以从〜19%增至〜40%。另一方面,通过使用后生长退火工艺缩短电子寿命,可以在零外部磁场下在〜180K时将光学自旋检测效率从〜6提高到〜23%,从〜6提高到〜23%。领域。

著录项

  • 来源
    《Applied physics express》 |2016年第2期|021201.1-021201.4|共4页
  • 作者单位

    National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China;

    National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China;

    Surface Physics Laboratory, Department of Physics, and Laboratory of Advanced Materials, Fudan University, Shanghai 200433, China;

    National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China;

    Surface Physics Laboratory, Department of Physics, and Laboratory of Advanced Materials, Fudan University, Shanghai 200433, China;

    National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China;

    National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China;

    National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号