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Simultaneous Compensation of Microstrip Feed and Patch by Defected Ground Structure for Reduced Cross-Polarized Radiation

机译:通过变形的地面结构同时补偿微带馈电和贴片,以减少交叉极化辐射

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摘要

This communication proposes a new idea of compensating spurious radiations usually occurring from the sharp transitions at patch to feed and feed to impedance transformer junctions which result in added cross-polarized (XP) fields in planar microstrip-fed patches. A strategic design and deployment of defected ground structure (DGS) have been explored successfully as a potential means to resolve such long-standing radiation issues. The quantum of radiations from the feed has been theoretically estimated. These along with the main source of XP fields (higher order mode) have been addressed by introducing a composite type of DGS. The experimental validation executed at the C-band establishes this simple low-cost solution with a promise of 10 to 14 dB improvement in the H-plane XP fields. It is also ensured that the proposed technique is equally useful in realizing dual-fed dual-polarized configurations without affecting the primary radiation and antenna performance.
机译:该通信提出了一种新的想法,即补偿通常由贴片到馈送和阻抗变换器结点的陡峭过渡而产生的寄生辐射,这会在平面微带馈送的贴片中增加交叉极化(XP)场。已经成功地探索了缺陷地面结构(DGS)的战略设计和部署,作为解决此类长期辐射问题的潜在手段。从理论上估计了来自进料的辐射量。通过引入DGS的复合类型,可以解决这些问题以及XP字段的主要来源(高阶模式)。在C波段执行的实验验证建立了这种简单的低成本解决方案,有望在H平面XP领域中提高10至14 dB。还确保了所提出的技术在实现双馈双极化配置时同样有用,而不会影响主辐射和天线性能。

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