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Asymmetric Geometry of Defected Ground Structure for Rectangular Microstrip: A New Approach to Reduce its Cross-Polarized Fields

机译:矩形微带弯曲地面结构的非对称几何:减少其交叉极化场的新方法

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摘要

A shaped defected ground structure (DGS) that is asymmetric in a specific radiating plane of a microstrip element has been explored with a view to addressing the cross-polarization (XP) issues. The asymmetric configuration has been conceived from an insight of the inherent asymmetry of the modal fields underneath a probe-fed microstrip patch and has been experimentally demonstrated as the best possible design compared to its predecessors in terms of the reduction in XP fields, angular span of suppression around boresight, and the space occupied by the defects. Different orientations of the defects with reference to the patches of different aspect ratio values have been thoroughly examined. More than 28-dB isolation between co-pol and cross-pol has been achieved over 190° angular range, which is indeed 140° more if compared with a conventional ground plane. Its superior characteristics with respect to the earlier designs have also been documented.
机译:为了解决交叉极化(XP)问题,已经研究了在微带元件的特定辐射平面内不对称的有缺陷的接地结构(DGS)。根据对探针馈送微带贴片下模态场的固有不对称性的理解,构想了不对称配置,并且在减少XP场,减小角跨度方面,已通过实验证明了其与前代相比是最佳的设计。抑制视轴周围以及缺陷所占据的空间。相对于不同长宽比值的贴片,缺陷的不同方向已被彻底检查。在190°的角度范围内,共极化和交叉极化之间的隔离度已超过28dB,与传统的接地平面相比,隔离度实际上提高了140°。与早期设计相比,它的优越特性也已被记录在案。

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