...
首页> 外文期刊>Advanced Packaging >Stencil Printing for Wafer Bumping: Statistical Process Control
【24h】

Stencil Printing for Wafer Bumping: Statistical Process Control

机译:模板印刷晶圆凸点:统计过程控制

获取原文
获取原文并翻译 | 示例
           

摘要

With the advent of type 5 and type 6 solder paste, and much effort in process development, stencil printing for wafer bumping has arrived. As with stencil printing for PCB assembling, the control of the volume of the solder paste stencil printed "brick" is crucial for high yields in wafer bumping. This need can best be met with an effective statistical process control (SPC) program for the wafer printing process. The purpose of this article is to provide an outline to establish a SPC program for a wafer bumping process.
机译:随着5型和6型焊膏的出现以及工艺开发中的巨大努力,用于晶圆凸点的模版印刷已经到来。与用于PCB组装的模版印刷一样,控制糊状模版印刷的“砖”的体积的控制对于晶圆隆起的高产量至关重要。可以通过针对晶片印刷过程的有效统计过程控制(SPC)程序来最好地满足这一需求。本文的目的是提供概述以建立用于晶片隆起过程的SPC程序。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号