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The Effect of Gate-Dielectric Surface Energy on Pentacene Morphology and Organic Field-Effect Transistor Characteristics

机译:栅介电表面能对并五苯形态和有机场效应晶体管特性的影响

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The effects of the surface energy of polymer gate dielectrics on pentacene morphology and the electrical properties of penta-cene field-effect transistors (FETs) are reported, using surface-energy-controllable poly(imide-siloxane)s as gate-dielectric layers. The surface energy of gate dielectrics strongly influences the pentacene film morphology and growth mode, producing Stranski-Krastanov growth with large and dendritic grains at high surface energy and three-dimensional island growth with small grains at low surface energy. In spite of the small grain size (≈300 nm) and decreased ordering of pentacene molecules vertical to the gate dielectric with low surface energy, the mobility of FETs with a low-surface-energy gate dielectric is larger by a factor of about five, compared to their high-surface-energy counterparts. In pentacene growth on the low-surface-energy gate dielectric, interconnection between grains is observed and gradual lateral growth of grains causes the vacant space between grains to be filled. Hence, the higher mobility of the FETs with low-surface-energy gate dielectrics can be achieved by interconnection and tight packing between pentacene grains. On the other hand, the high-surface-energy dielectric forms the first pentacene layer with some voids and then successive, incomplete layers over the first, which can limit the transport of charge carriers and cause lower carrier mobility, in spite of the formation of large grains (≈ 1.3 μm) in a thicker pentacene film.
机译:报道了使用表面能可控的聚(酰亚胺-硅氧烷)作为栅介电层,聚合物栅电介质的表面能对并五苯形态和五并场场效应晶体管(FET)的电性能的影响。栅极电介质的表面能强烈影响并五苯薄膜的形貌和生长方式,在高表面能下产生具有大而树枝状晶粒的Stranski-Krastanov生长,在低表面能下产生具有小晶粒的三维岛状生长。尽管具有较小的晶粒尺寸(≈300nm),并且并五苯分子垂直于具有较低表面能的栅极电介质的顺序减小,但是具有低表面能栅极电介质的FET的迁移率却大了约五倍,相较于他们的高表面能同行。在低表面能栅极电介质上并五苯生长中,观察到晶粒之间的互连,并且晶粒的逐渐横向生长导致晶粒之间的空余空间被填充。因此,可以通过并五苯晶粒之间的互连和紧密堆积来实现具有低表面能栅极电介质的FET的更高迁移率。另一方面,高表面能电介质形成具有一定空隙的第一并五苯层,然后在第一并五苯层上形成连续,不完整的层,尽管形成了下列结构,但仍会限制电荷载流子的传输并导致较低的载流子迁移率较厚的并五苯薄膜中的大晶粒(≈1.3μm)。

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