X-Ray Topographic Studies of Defect Structure in YVO_4 Crystals

摘要

The perfection of YVO_4 crystals, which are predicted to replace formerly used YAG garnets due to higher quantum efficiency and lower excitation level, was studied. The investigations of Czochralski grown undoped YVO_4 single crystals were performed mainly by means of X-ray topographic methods. Both synchrotron and conventional X-ray sources were used. The study revealed relatively high density of weak point-like contrasts which can be most probably interpreted as dislocation outcrops. In regions of the crystal close to its boundary we observed glide bands. It was also found that in some regions the dislocations form local subgrain boundaries. The white beam back reflection and monochromatic beam topography allowed to evaluate a local misorientation which not exceeded several angular minutes. No segregation fringes were observed proving a good homogeneity of chemical composition.