Non-Destructive Characterization, Inspection, Failure Analysis of Advanced Components and Sensors with a High Resolution and High Contrast Micro XCT System

摘要

3D X-ray microtomography (Micro XCT) can non-destructively characterize, inspect and solve many failure analysis problems associated with the manufacture of advanced materials, components, finished products, sensors for the military and industry. Our novel high resolution and high contrast micro CT can be used to visualize defects at the micrometer and sub-micrometer length scales, typically encountered in the manufacturing and development of advanced sensors and polymer composites.