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Fabrication and photocatalytic properties of silicon nanowires by metal-assisted chemical etching: effect of H2O2 concentration

机译:金属辅助化学刻蚀法制备硅纳米线及其光催化性能:H2O2浓度的影响

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摘要

In the current study, monocrystalline silicon nanowire arrays (SiNWs) were prepared through a metal-assisted chemical etching method of silicon wafers in an etching solution composed of HF and H2O2. Photoelectric properties of the monocrystalline SiNWs are improved greatly with the formation of the nanostructure on the silicon wafers. By controlling the hydrogen peroxide concentration in the etching solution, SiNWs with different morphologies and surface characteristics are obtained. A reasonable mechanism of the etching process was proposed. Photocatalytic experiment shows that SiNWs prepared by 20% H2O2 etching solution exhibit the best activity in the decomposition of the target organic pollutant, Rhodamine B (RhB), under Xe arc lamp irradiation for its appropriate Si nanowire density with the effect of Si content and contact area of photocatalyst and RhB optimized.
机译:在当前的研究中,单晶硅纳米线阵列(SiNWs)是通过在HF和H2O2组成的蚀刻溶液中通过硅片的金属辅助化学蚀刻方法制备的。随着硅晶片上纳米结构的形成,单晶SiNW的光电性能得到了极大的改善。通过控制蚀刻溶液中的过氧化氢浓度,可以获得具有不同形态和表面特性的SiNW。提出了合理的刻蚀机理。光催化实验表明,在Xe弧光灯照射下,以20%H2O2刻蚀溶液制备的SiNW在目标有机污染物若丹明B(RhB)的分解中表现出最佳的活性,并具有适当的Si纳米线密度,并受Si含量和接触的影响。优化的光催化剂面积和RhB。

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